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Journal: Electronics, 2020
Volume: 9
Number: 625
Article:
Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS
Authors:
by
Ju Feng, Tianhua Meng, Yuhe Lu, Jianguang Ren, Guozhong Zhao, Hongmei Liu, Jin Yang and Rong Huang
Link:
https://www.mdpi.com/2079-9292/9/4/625
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