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Journal: Electronics, 2020
Volume: 9
Number: 625

Article: Nondestructive Testing of Hollowing Deterioration of the Yungang Grottoes Based on THz-TDS
Authors: by Ju Feng, Tianhua Meng, Yuhe Lu, Jianguang Ren, Guozhong Zhao, Hongmei Liu, Jin Yang and Rong Huang
Link: https://www.mdpi.com/2079-9292/9/4/625

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