Ragonese, E.;                     Nocera, C.;                     Cavarra, A.;                     Papotto, G.;                     Spataro, S.;                     Palmisano, G.    
        A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology. Electronics 2020, 9, 2124.
    https://doi.org/10.3390/electronics9122124
    AMA Style
    
                                Ragonese E,                                 Nocera C,                                 Cavarra A,                                 Papotto G,                                 Spataro S,                                 Palmisano G.        
                A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology. Electronics. 2020; 9(12):2124.
        https://doi.org/10.3390/electronics9122124
    
    Chicago/Turabian Style
    
                                Ragonese, Egidio,                                 Claudio Nocera,                                 Andrea Cavarra,                                 Giuseppe Papotto,                                 Simone Spataro,                                 and Giuseppe Palmisano.        
                2020. "A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology" Electronics 9, no. 12: 2124.
        https://doi.org/10.3390/electronics9122124
    
    APA Style
    
                                Ragonese, E.,                                 Nocera, C.,                                 Cavarra, A.,                                 Papotto, G.,                                 Spataro, S.,                                 & Palmisano, G.        
        
        (2020). A Comparative Analysis between Standard and mm-Wave Optimized BEOL in a Nanoscale CMOS Technology. Electronics, 9(12), 2124.
        https://doi.org/10.3390/electronics9122124