Sobanska, M.; Garro, N.; Klosek, K.; Cros, A.; Zytkiewicz, Z.R.
Influence of Si Substrate Preparation Procedure on Polarity of Self-Assembled GaN Nanowires on Si(111): Kelvin Probe Force Microscopy Studies. Electronics 2020, 9, 1904.
https://doi.org/10.3390/electronics9111904
AMA Style
Sobanska M, Garro N, Klosek K, Cros A, Zytkiewicz ZR.
Influence of Si Substrate Preparation Procedure on Polarity of Self-Assembled GaN Nanowires on Si(111): Kelvin Probe Force Microscopy Studies. Electronics. 2020; 9(11):1904.
https://doi.org/10.3390/electronics9111904
Chicago/Turabian Style
Sobanska, Marta, Núria Garro, Kamil Klosek, Ana Cros, and Zbigniew R. Zytkiewicz.
2020. "Influence of Si Substrate Preparation Procedure on Polarity of Self-Assembled GaN Nanowires on Si(111): Kelvin Probe Force Microscopy Studies" Electronics 9, no. 11: 1904.
https://doi.org/10.3390/electronics9111904
APA Style
Sobanska, M., Garro, N., Klosek, K., Cros, A., & Zytkiewicz, Z. R.
(2020). Influence of Si Substrate Preparation Procedure on Polarity of Self-Assembled GaN Nanowires on Si(111): Kelvin Probe Force Microscopy Studies. Electronics, 9(11), 1904.
https://doi.org/10.3390/electronics9111904