Caria, A.;                     De Santi, C.;                     Dogmus, E.;                     Medjdoub, F.;                     Zanoni, E.;                     Meneghesso, G.;                     Meneghini, M.    
        Excitation Intensity and Temperature-Dependent Performance of InGaN/GaN Multiple Quantum Wells Photodetectors. Electronics 2020, 9, 1840.
    https://doi.org/10.3390/electronics9111840
    AMA Style
    
                                Caria A,                                 De Santi C,                                 Dogmus E,                                 Medjdoub F,                                 Zanoni E,                                 Meneghesso G,                                 Meneghini M.        
                Excitation Intensity and Temperature-Dependent Performance of InGaN/GaN Multiple Quantum Wells Photodetectors. Electronics. 2020; 9(11):1840.
        https://doi.org/10.3390/electronics9111840
    
    Chicago/Turabian Style
    
                                Caria, Alessandro,                                 Carlo De Santi,                                 Ezgi Dogmus,                                 Farid Medjdoub,                                 Enrico Zanoni,                                 Gaudenzio Meneghesso,                                 and Matteo Meneghini.        
                2020. "Excitation Intensity and Temperature-Dependent Performance of InGaN/GaN Multiple Quantum Wells Photodetectors" Electronics 9, no. 11: 1840.
        https://doi.org/10.3390/electronics9111840
    
    APA Style
    
                                Caria, A.,                                 De Santi, C.,                                 Dogmus, E.,                                 Medjdoub, F.,                                 Zanoni, E.,                                 Meneghesso, G.,                                 & Meneghini, M.        
        
        (2020). Excitation Intensity and Temperature-Dependent Performance of InGaN/GaN Multiple Quantum Wells Photodetectors. Electronics, 9(11), 1840.
        https://doi.org/10.3390/electronics9111840