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Journal: Electronics, 2020
Volume: 9
Number: 1719

Article: Application of Polarization Coulomb Field Scattering to a Physics-Based Compact Model for AlGaN/GaN HFETs with I–V Characteristics
Authors: by Yongxiong Yang, Yuanjie Lv, Zhaojun Lin, Guangyuan Jiang and Yang Liu
Link: https://www.mdpi.com/2079-9292/9/10/1719

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