Article Versions Notes

Park J, Kim D-K, Park J-I, Kang IM, Jang J, Kim H, Lang P, Bae J-H. Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors. Electronics. 2020; 9(1):119. https://doi.org/10.3390/electronics9010119

Park, Jihwan, Do-Kyung Kim, Jun-Ik Park, In Man Kang, Jaewon Jang, Hyeok Kim, Philippe Lang, and Jin-Hyuk Bae. 2020. "Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors" Electronics 9, no. 1: 119. https://doi.org/10.3390/electronics9010119

Park, J., Kim, D.-K., Park, J.-I., Kang, I. M., Jang, J., Kim, H., Lang, P., & Bae, J.-H. (2020). Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors. Electronics, 9(1), 119. https://doi.org/10.3390/electronics9010119