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Journal: Electronics, 2019
Volume: 8
Number: 947

Article: Effect of Annealing Environment on the Performance of Sol–Gel-Processed ZrO2 RRAM
Authors: by Seunghyun Ha, Hyunjae Lee, Won-Yong Lee, Bongho Jang, Hyuk-Jun Kwon, Kwangeun Kim and Jaewon Jang
Link: https://www.mdpi.com/2079-9292/8/9/947

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