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Open AccessArticle

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Micro and Nanoelectronics Systems Design and Research Laboratory, Vilnius Gediminas Technical University, 10257 Vilnius, Lithuania
Author to whom correspondence should be addressed.
Electronics 2019, 8(7), 813;
Received: 19 June 2019 / Revised: 17 July 2019 / Accepted: 18 July 2019 / Published: 20 July 2019
(This article belongs to the Section Microelectronics and Optoelectronics)
PDF [9791 KB, uploaded 20 July 2019]


In this paper, an oscillation-based built-in self-test system for active an analog integrated circuit is presented. This built-in self-test system was used to detect catastrophic and parametric faults, introduced during chip manufacturing. As circuits under test (CUT), second-order Sallen-Key, Akerberg-Mossberg and Tow-Thomas biquad filters were designed. The proposed test hardware detects parametric and catastrophic faults on changeable limits. The influence of both oscillation and test hardware on fault detection limits were investigated and analyzed. The proposed oscillation based self-test system was designed and simulated in 0.18 µm complementary metal-oxide semiconductor (CMOS) technology. Due to the easiness of implementation and configuration for testing of different active analog filters, such self-test systems can be effectively used in modern integrated circuits, made of a large number of devices and circuits, such as the multi-standard transceivers used in the core hardware of software-defined radios. Using the proposed test strategy, the fault tolerance limits for catastrophic faults varied from 96% to 100% for all injected faults in different structures of low pass filters (LPF). The detection range of parametric faults of passive components’ nominal value, depending on the used structure of the filter, did not exceed –0.74% – 0.72% in case of Sallen-Key, –3.31% – 1.00% in case of Akerberg-Mossberg and –2.39% – 1.44% in case of Tow-Thomas LPF. View Full-Text
Keywords: CMOS; self-test; analog filter; low-pass; oscillation; transmission gate CMOS; self-test; analog filter; low-pass; oscillation; transmission gate

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Kladovščikov, L.; Jurgo, M.; Navickas, R. Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS. Electronics 2019, 8, 813.

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