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Journal: Electronics, 2019
Volume: 8
Number: 210

Article: Design of Experiment (DOE) Analysis of System Level ESD Noise Coupling to High-Speed Memory Modules
Authors: by Jawad Yousaf, Muhammad Faisal, Jinsung Youn and Wansoo Nah
Link: https://www.mdpi.com/2079-9292/8/2/210

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