VCMA-MRAM In-Memory Stochastic Sampling for Edge Boltzmann Machine Inference
Abstract
1. Introduction
- MRAM Design & Energy Efficiency: We design a 192 Kbit VCMA-MTJ-based MRAM macro featuring a synchronous, configurable pulse voltage scheme. By avoiding the continuous static leakage of asynchronous architectures, the proposed memory achieves ultra-low-power probabilistic sampling. It operates with an intrinsic cell energy of ∼10 fJ and a quantified macro-level energy of ∼30.8 pJ per update. This delivers a 1 to 2 orders of magnitude energy reduction compared to both pure software PRNG implementations and asynchronous hardware baselines.
- Architecture & Circuit Design: We propose a hardware–algorithm co-designed architecture tailored for generative probabilistic models on edge devices. By integrating an on-chip configurable pulse generator, the system performs highly accurate, voltage-controlled in-memory stochastic sampling. This inherently retains model states in non-volatile memory and entirely eliminates the extensive data movement and Boolean logic computation costs required by traditional digital systems.
- System-Level Validation & Calibration: We establish an end-to-end hardware prototype integrating an MCU and the fabricated VCMA-MRAM chip to deploy a multi-sensor anomaly detection task. To combat inherent device-to-device variability, we introduce a clustering-based calibration step; ablation control experiments confirm that this method effectively suppresses systematic false alarms, restoring the hardware F1-score to 0.9854 and remarkably outperforming pseudo-random software baselines by leveraging correlation-free physical true-randomness.
2. Background
2.1. Probability-Flipping Characteristics of VCMA-MTJ
2.2. MRAM Structure
3. System Architecture and Network Deployment
3.1. System Design Overview
- Configuration Phase (Write Mode): The MCU initializes the system or loads input data. By setting the DAC to a high write voltage (2.4 V), the VCMA-MTJ states are deterministically set to represent the initial visible or hidden layer configurations.
- Stochastic Sampling Phase (Sampling Mode): During inference, the MCU retrieves the binary states (0 or 1) of the current layer. Leveraging the binary state property, the MCU performs a lightweight accumulation of the relevant weights instead of intensive matrix-vector multiplications. This sum is mapped to a sampling voltage and applied as a 0.49 ns pulse. The VCMA-MTJ then performs the “sampling” operation in-memory via its stochastic switching, effectively generating the next layer’s states.
- State Retrieval Phase (Read Mode): The updated states of the VCMA-MTJs are sensed via a low-voltage (0.4 V) readout circuit. The comparative result is fed back to the MCU to update the network status or for the next iteration of Gibbs sampling.
3.2. RBM/DBM Implementation with MRAM
3.3. Clustering Analysis for Performance Optimization
4. Results and Discussions
4.1. Experimental Setup and Software Baseline
4.2. On-Hardware Results
4.3. Energy Consumption Analysis
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
- Aslan, N.; Dogan, S.; Koca, G.O. Automated classification of brain diseases using the Restricted Boltzmann Machine and the Generative Adversarial Network. Eng. Appl. Artif. Intell. 2023, 126, 106794. [Google Scholar] [CrossRef]
- Lü, X.; Long, L.; Deng, R.; Meng, R. Image feature extraction based on fuzzy restricted Boltzmann machine. Measurement 2022, 204, 112063. [Google Scholar] [CrossRef]
- Luo, X.; Feng, Y. An underwater acoustic target recognition method based on restricted Boltzmann machine. Sensors 2020, 20, 5399. [Google Scholar] [CrossRef] [PubMed]
- Borders, W.A.; Pervaiz, A.Z.; Fukami, S.; Camsari, K.Y.; Ohno, H.; Datta, S. Integer factorization using stochastic magnetic tunnel junctions. Nature 2019, 573, 390–393. [Google Scholar] [CrossRef] [PubMed]
- Jung, S.; Lee, H.; Myung, S.; Kim, H.; Yoon, S.K.; Kwon, S.W.; Ju, Y.; Kim, M.; Yi, W.; Han, S.; et al. A crossbar array of magnetoresistive memory devices for in-memory computing. Nature 2022, 601, 211–216. [Google Scholar] [CrossRef] [PubMed]
- Zhang, R.; Li, X.; Wan, C.; Hoffmann, R.; Hindenberg, M.; Xu, Y.; Liu, S.; Kong, D.; Xiong, S.; He, S.; et al. Probabilistic greedy algorithm solver using magnetic tunneling junctions for traveling salesman problem. Nat. Commun. 2025, 17, 189. [Google Scholar] [CrossRef] [PubMed]
- Wang, C.; Wang, Z.; Li, S.; Zhang, Z.; Zhang, Y. Variation aware evaluation approach and design methodology for SOT-MRAM. IEEE Trans. Circuits Syst. I Regul. Pap. 2024, 71, 1651–1664. [Google Scholar] [CrossRef]
- Verma, G.; Soni, S.; Nisar, A.; Kaushik, B.K. Multi-bit MRAM based high performance neuromorphic accelerator for image classification. Neuromorphic Comput. Eng. 2024, 4, 014008. [Google Scholar] [CrossRef]
- Jahannia, B.; Ghasemi, S.A.; Farbeh, H. An energy efficient multi-retention STT-MRAM memory architecture for IoT applications. IEEE Trans. Circuits Syst. II Express Briefs 2023, 71, 1431–1435. [Google Scholar] [CrossRef]
- Yuan, X.; Jian, J.; Chai, Z.; An, S.; Gao, Y.; Zhou, X.; Zhang, J.F.; Zhang, W.; Min, T. Markov Chain Signal Generation Based on Single Magnetic Tunnel Junction. IEEE Electron Device Lett. 2023, 44, 1963–1966. [Google Scholar] [CrossRef]
- Li, X.; Wan, C.; Zhang, R.; Zhao, M.; Xiong, S.; Kong, D.; Luo, X.; He, B.; Liu, S.; Xia, J.; et al. Restricted Boltzmann machines implemented by spin–orbit torque magnetic tunnel junctions. Nano Lett. 2024, 24, 5420–5428. [Google Scholar] [CrossRef] [PubMed]
- Singh, N.S.; Kobayashi, K.; Cao, Q.; Selcuk, K.; Hu, T.; Niazi, S.; Aadit, N.A.; Kanai, S.; Ohno, H.; Fukami, S.; et al. CMOS plus stochastic nanomagnets enabling heterogeneous computers for probabilistic inference and learning. Nat. Commun. 2024, 15, 2685. [Google Scholar] [CrossRef] [PubMed]
- Duffee, C.; Athas, J.; Shao, Y.; Melendez, N.D.; Raimondo, E.; Katine, J.A.; Camsari, K.Y.; Finocchio, G.; Khalili Amiri, P. An integrated-circuit-based probabilistic computer that uses voltage-controlled magnetic tunnel junctions as its entropy source. Nat. Electron. 2025, 8, 784–793. [Google Scholar] [CrossRef]
- Huang, W.; Zhang, K.; Wang, J.; Liu, Y.; Zhang, B.; Zhang, Y.; Zhao, W.; Zeng, L.; Zhang, D. A Novel P-bit Unit Based on VGSOT-MTJ for Reconfigurable Ising Machine With Fully Parallel Spin Updating Design. IEEE Electron Device Lett. 2025, 46, 1889–1892. [Google Scholar] [CrossRef]
- Shao, Y.; Khalili Amiri, P. Progress and application perspectives of voltage-controlled magnetic tunnel junctions. Adv. Mater. Technol. 2023, 8, 2300676. [Google Scholar] [CrossRef]
- Suhail, H.; He, H.; Yang, J.; Shu, Q.; Wang, C.Y.; Yang, S.Y.; Hsin, Y.C.; Shih, C.Y.; Lee, H.H.; Wu, D.; et al. The first CMOS-integrated voltage-controlled MRAM with 0.7 ns switching time. In Proceedings of the 2023 International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 9–13 December 2023; IEEE: New York, NY, USA, 2023; pp. 1–4. [Google Scholar]
- Kang, W.; Ran, Y.; Zhang, Y.; Lv, W.; Zhao, W. Modeling and exploration of the voltage-controlled magnetic anisotropy effect for the next-generation low-power and high-speed MRAM applications. IEEE Trans. Nanotechnol. 2017, 16, 387–395. [Google Scholar] [CrossRef]
- Alzate, J.G.; Amiri, P.K.; Upadhyaya, P.; Cherepov, S.; Zhu, J.; Lewis, M.; Dorrance, R.; Katine, J.; Langer, J.; Galatsis, K.; et al. Voltage-induced switching of nanoscale magnetic tunnel junctions. In Proceedings of the 2012 International Electron Devices Meeting, San Francisco, CA, USA, 10–13 December 2012; IEEE: New York, NY, USA, 2012; pp. 29.5.1–29.5.4. [Google Scholar]
- Ikeda, S.; Miura, K.; Yamamoto, H.; Mizunuma, K.; Gan, H.; Endo, M.; Kanai, S.; Hayakawa, J.; Matsukura, F.; Ohno, H. A perpendicular-anisotropy CoFeB–MgO magnetic tunnel junction. Nat. Mater. 2010, 9, 721–724. [Google Scholar] [CrossRef] [PubMed]
- Daniel, V.A.A.; Vijayalakshmi, K.; Pawar, P.P.; Kumar, D.; Bhuvanesh, A.; Christilda, A.J. Enhanced affinity propagation clustering with a modified extreme learning machine for segmentation and classification of hyperspectral imaging. e-Prime Adv. Electr. Eng. Electron. Energy 2024, 9, 100704. [Google Scholar] [CrossRef]
- Singh, A.P.; Chaudhari, S. Room Occupancy Estimation; UCI Machine Learning Repository: Irvine, CA, USA, 2018. [Google Scholar] [CrossRef]
- Ambiq Micro. Apollo4 Blue Plus SoC Datasheet. 2023. Available online: https://ambiq.com/apollo4-blue-plus/ (accessed on 1 March 2026).
- STMicroelectronics. STM32L476xx Ultra-Low-Power Arm Cortex-M4 32-Bit MCU+FPU Datasheet; STMicroelectronics: Geneva, Switzerland, 2021; Rev. 7. [Google Scholar]
- Mittal, S. A survey of techniques for approximate computing. ACM Comput. Surv. (CSUR) 2016, 48, 62. [Google Scholar] [CrossRef]
- Lee, W.; Kim, H.; Jung, H.; Choi, Y.; Jeon, J.; Kim, C. Correlation free large-scale probabilistic computing using a true-random chaotic oscillator p-bit. Sci. Rep. 2025, 15, 8018. [Google Scholar] [CrossRef] [PubMed]









| Operation | Amplitude (V) | Width (ns) | Probability of Flipping |
|---|---|---|---|
| Read | 0.4 | 0.49 | 0 |
| Write | 2.4 | 0.49 | 1 |
| Sampling | v | 0.49 |
| Evaluation Metrics | Average | Standard Deviation |
|---|---|---|
| Accuracy | 0.9940 | 0.0006 |
| Precision | 0.9892 | 0.0033 |
| Recall | 0.9788 | 0.0002 |
| F1-score | 0.9840 | 0.0017 |
| Reference/Year | Hardware Platform | Entropy Source & Update Mechanism | Macro/System Energy | Device/Cell Energy |
|---|---|---|---|---|
| Software Baseline | General Edge MCU | Software PRNG + Activation | >1000 pJ | N/A |
| Borders et al. (2019) [4] | MCU + s-MTJ | Stochastic MTJ (Asynchronous) | 1027 pJ | – |
| Singh et al. (2024) [12] | FPGA + s-MTJ | Stochastic MTJ (Asynchronous) | 1691 pJ | – |
| Kim et al. (2024) [25] | Digital ASIC | Chaotic Oscillator (True-random) | – | 4.26 pJ |
| Duffee et al. (2025) [13] | ASIC + V-MTJ | VCMA-MTJ (Synchronous) | 34.4 pJ | 0.43 pJ (430 fJ) |
| This Work | Custom MRAM Macro | VCMA-MTJ (Synchronous) | ∼30.8 pJ | ∼0.01 pJ (10 fJ) |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Deng, X.; Li, Y.; Fang, B.; Wang, L. VCMA-MRAM In-Memory Stochastic Sampling for Edge Boltzmann Machine Inference. Electronics 2026, 15, 1622. https://doi.org/10.3390/electronics15081622
Deng X, Li Y, Fang B, Wang L. VCMA-MRAM In-Memory Stochastic Sampling for Edge Boltzmann Machine Inference. Electronics. 2026; 15(8):1622. https://doi.org/10.3390/electronics15081622
Chicago/Turabian StyleDeng, Xuesheng, Yuesheng Li, Bin Fang, and Lin Wang. 2026. "VCMA-MRAM In-Memory Stochastic Sampling for Edge Boltzmann Machine Inference" Electronics 15, no. 8: 1622. https://doi.org/10.3390/electronics15081622
APA StyleDeng, X., Li, Y., Fang, B., & Wang, L. (2026). VCMA-MRAM In-Memory Stochastic Sampling for Edge Boltzmann Machine Inference. Electronics, 15(8), 1622. https://doi.org/10.3390/electronics15081622

