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Journal: Electronics, 2026
Volume: 15
Number: 673

Article: Thermal Degradation Diagnosis of ATE Driver Boards Using ALT-Derived Cumulative Degradation Time
Authors: by Heechan Lee, Seongbeom Hong, Junhyeong Ji and Youbean Kim
Link: https://www.mdpi.com/2079-9292/15/3/673

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