Yu, B.; Bai, T.; Si, J.; Jin, Y.; Liu, L.; Cai, G.; Shen, M.; Lai, Z.; Mu, H.
Field-Measurement-Based Wideband Modeling and System-Level Simulation of MMC-HVDC Converter Stations for High-Frequency Disturbance Studies. Electronics 2026, 15, 3860.
https://doi.org/10.3390/electronics15173860
AMA Style
Yu B, Bai T, Si J, Jin Y, Liu L, Cai G, Shen M, Lai Z, Mu H.
Field-Measurement-Based Wideband Modeling and System-Level Simulation of MMC-HVDC Converter Stations for High-Frequency Disturbance Studies. Electronics. 2026; 15(17):3860.
https://doi.org/10.3390/electronics15173860
Chicago/Turabian Style
Yu, Bing, Tong Bai, Jiangfeng Si, Yongtao Jin, Li Liu, Guangsheng Cai, Maoqun Shen, Zekai Lai, and Haibao Mu.
2026. "Field-Measurement-Based Wideband Modeling and System-Level Simulation of MMC-HVDC Converter Stations for High-Frequency Disturbance Studies" Electronics 15, no. 17: 3860.
https://doi.org/10.3390/electronics15173860
APA Style
Yu, B., Bai, T., Si, J., Jin, Y., Liu, L., Cai, G., Shen, M., Lai, Z., & Mu, H.
(2026). Field-Measurement-Based Wideband Modeling and System-Level Simulation of MMC-HVDC Converter Stations for High-Frequency Disturbance Studies. Electronics, 15(17), 3860.
https://doi.org/10.3390/electronics15173860
