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Journal: Electronics, 2026
Volume: 15
Number: 2136

Article: Robust Transmission Line Defect Detection in Fog via Structure-Preserving and Degradation-Aware Enhancement
Authors: by Jiayin Li, Yue Lang, Jingfei Shen, Binbin Ma and Shuang Li
Link: https://www.mdpi.com/2079-9292/15/10/2136

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