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Electronics2025, 14(7), 1475;https://doi.org/10.3390/electronics14071475

Journal: ElectronicsVolume: 14Number: 1475

Article: RETRACTED: Zhang et al. Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics 2024, 13, 2347

Authors:
Jingping Zhang¹,
Houcai Luo¹ and
Huan Wu¹
et al.

Link: https://www.mdpi.com/2079-9292/14/7/1475

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