Article Versions Notes

Zhang J, Luo H, Wu H, Zheng B, Chen X, Zhang G, French P, Wang S. RETRACTED: Zhang et al. Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics 2024, 13, 2347. Electronics. 2025; 14(7):1475. https://doi.org/10.3390/electronics14071475

Zhang, Jingping, Houcai Luo, Huan Wu, Bofeng Zheng, Xianping Chen, Guoqi Zhang, Paddy French, and Shaogang Wang. 2025. "RETRACTED: Zhang et al. Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics 2024, 13, 2347" Electronics 14, no. 7: 1475. https://doi.org/10.3390/electronics14071475

Zhang, J., Luo, H., Wu, H., Zheng, B., Chen, X., Zhang, G., French, P., & Wang, S. (2025). RETRACTED: Zhang et al. Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics 2024, 13, 2347. Electronics, 14(7), 1475. https://doi.org/10.3390/electronics14071475