Sun, Y.; Ma, K.; Yuan, X.; Chen, A.; Liu, X.; Song, Y.; Li, X.; Zi, T.; Zhou, Y.; Liu, S.
Investigation of a Physical Model for the Reverse Recovery Characteristics of PT-PIN FRD with a Buffer Layer. Electronics 2025, 14, 570.
https://doi.org/10.3390/electronics14030570
AMA Style
Sun Y, Ma K, Yuan X, Chen A, Liu X, Song Y, Li X, Zi T, Zhou Y, Liu S.
Investigation of a Physical Model for the Reverse Recovery Characteristics of PT-PIN FRD with a Buffer Layer. Electronics. 2025; 14(3):570.
https://doi.org/10.3390/electronics14030570
Chicago/Turabian Style
Sun, Yameng, Kun Ma, Xiong Yuan, Anning Chen, Xun Liu, Yifan Song, Xuehan Li, Tongtong Zi, Yang Zhou, and Sheng Liu.
2025. "Investigation of a Physical Model for the Reverse Recovery Characteristics of PT-PIN FRD with a Buffer Layer" Electronics 14, no. 3: 570.
https://doi.org/10.3390/electronics14030570
APA Style
Sun, Y., Ma, K., Yuan, X., Chen, A., Liu, X., Song, Y., Li, X., Zi, T., Zhou, Y., & Liu, S.
(2025). Investigation of a Physical Model for the Reverse Recovery Characteristics of PT-PIN FRD with a Buffer Layer. Electronics, 14(3), 570.
https://doi.org/10.3390/electronics14030570