Li, Y.; Diao, X.; Li, Q.; Meng, Z.; Chen, T.; Lin, Y.; Hao, Y.; Gao, X.
An Ensemble Imbalanced Classification Framework via Dual-Perspective Overlapping Analysis with Multi-Resolution Metrics. Electronics 2025, 14, 4740.
https://doi.org/10.3390/electronics14234740
AMA Style
Li Y, Diao X, Li Q, Meng Z, Chen T, Lin Y, Hao Y, Gao X.
An Ensemble Imbalanced Classification Framework via Dual-Perspective Overlapping Analysis with Multi-Resolution Metrics. Electronics. 2025; 14(23):4740.
https://doi.org/10.3390/electronics14234740
Chicago/Turabian Style
Li, Yuan, Xinping Diao, Qiangwei Li, Zhihang Meng, Tianyang Chen, Yukun Lin, Yu Hao, and Xin Gao.
2025. "An Ensemble Imbalanced Classification Framework via Dual-Perspective Overlapping Analysis with Multi-Resolution Metrics" Electronics 14, no. 23: 4740.
https://doi.org/10.3390/electronics14234740
APA Style
Li, Y., Diao, X., Li, Q., Meng, Z., Chen, T., Lin, Y., Hao, Y., & Gao, X.
(2025). An Ensemble Imbalanced Classification Framework via Dual-Perspective Overlapping Analysis with Multi-Resolution Metrics. Electronics, 14(23), 4740.
https://doi.org/10.3390/electronics14234740
