He, Z.; Li, H.; Tian, S.; Wen, J.; Yuan, G.; Li, A.
A Comparative Study of Structured and Narrative EHR Data for 30-Day Readmission Risk Assessment. Electronics 2025, 14, 4033.
https://doi.org/10.3390/electronics14204033
AMA Style
He Z, Li H, Tian S, Wen J, Yuan G, Li A.
A Comparative Study of Structured and Narrative EHR Data for 30-Day Readmission Risk Assessment. Electronics. 2025; 14(20):4033.
https://doi.org/10.3390/electronics14204033
Chicago/Turabian Style
He, Zhengxiao, Huayu Li, Siyuan Tian, Jinghao Wen, Geng Yuan, and Ao Li.
2025. "A Comparative Study of Structured and Narrative EHR Data for 30-Day Readmission Risk Assessment" Electronics 14, no. 20: 4033.
https://doi.org/10.3390/electronics14204033
APA Style
He, Z., Li, H., Tian, S., Wen, J., Yuan, G., & Li, A.
(2025). A Comparative Study of Structured and Narrative EHR Data for 30-Day Readmission Risk Assessment. Electronics, 14(20), 4033.
https://doi.org/10.3390/electronics14204033