Ouyang, C.; Mao, J.; Li, Y.; Li, T.; Zhu, D.; Zhou, C.; Xu, Z.
Federated Learning for Extreme Label Noise: Enhanced Knowledge Distillation and Particle Swarm Optimization. Electronics 2025, 14, 366.
https://doi.org/10.3390/electronics14020366
AMA Style
Ouyang C, Mao J, Li Y, Li T, Zhu D, Zhou C, Xu Z.
Federated Learning for Extreme Label Noise: Enhanced Knowledge Distillation and Particle Swarm Optimization. Electronics. 2025; 14(2):366.
https://doi.org/10.3390/electronics14020366
Chicago/Turabian Style
Ouyang, Chengtian, Jihong Mao, Yehong Li, Taiyong Li, Donglin Zhu, Changjun Zhou, and Zhenyu Xu.
2025. "Federated Learning for Extreme Label Noise: Enhanced Knowledge Distillation and Particle Swarm Optimization" Electronics 14, no. 2: 366.
https://doi.org/10.3390/electronics14020366
APA Style
Ouyang, C., Mao, J., Li, Y., Li, T., Zhu, D., Zhou, C., & Xu, Z.
(2025). Federated Learning for Extreme Label Noise: Enhanced Knowledge Distillation and Particle Swarm Optimization. Electronics, 14(2), 366.
https://doi.org/10.3390/electronics14020366