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Journal: Electronics, 2025
Volume: 14
Number: 3960

Article: CISC-YOLO: A Lightweight Network for Micron-Level Defect Detection on Wafers via Efficient Cross-Scale Feature Fusion
Authors: by Yulun Chi, Xingyu Gong, Bing Zhao and Lei Yao
Link: https://www.mdpi.com/2079-9292/14/19/3960

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