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        Journal: Electronics, 2025
        Volume: 14 
                	Number: 3960 
                
        
        Article:
        CISC-YOLO: A Lightweight Network for Micron-Level Defect Detection on Wafers via Efficient Cross-Scale Feature Fusion 
        Authors: 
       	by
                    Yulun Chi, Xingyu Gong, Bing Zhao and Lei Yao        
        Link:
        https://www.mdpi.com/2079-9292/14/19/3960
        
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