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Journal: Electronics, 2025
Volume: 14
Number: 3767
Article:
IPE-YOLO: A Multi-Scale Defect Detection Method for Power Equipment Inspection
Authors:
by
Mingxia Xu, Zibo Cai, Kewei Cai, Dongpu Li, Yongsheng Miao and Chuanfang Xu
Link:
https://www.mdpi.com/2079-9292/14/19/3767
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