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Journal: Electronics, 2025
Volume: 14
Number: 2653

Article: Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs
Authors: by Huixiang Huang, Zhipeng Wu, Chao Peng, Hanxin Shen, Xiaoqiang Wu, Jianqun Yang, Zhifeng Lei, Xiuhai Cui, Teng Ma, Zhangang Zhang, Yujuan He, Yiqiang Chen and Guoguang Lu
Link: https://www.mdpi.com/2079-9292/14/13/2653

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