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Journal: Electronics, 2025
Volume: 14
Number: 2538

Article: MTBF-PoL Reliability Evaluation and Comparison Using Prediction Standard MIL-HDBK-217F vs. SN 29500
Authors: by Dan Butnicu and Gabriel Bonteanu
Link: https://www.mdpi.com/2079-9292/14/13/2538

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