Lin, J.; Ji, T.; Zhu, H.; Wang, Y.; Hu, J.; Sun, Y.; Wang, W.
Low-Cost Robust Detection Method of Interturn Short-Circuit Fault for Distribution Transformer Based on ΔU-I Locus Characteristic. Electronics 2025, 14, 2458.
https://doi.org/10.3390/electronics14122458
AMA Style
Lin J, Ji T, Zhu H, Wang Y, Hu J, Sun Y, Wang W.
Low-Cost Robust Detection Method of Interturn Short-Circuit Fault for Distribution Transformer Based on ΔU-I Locus Characteristic. Electronics. 2025; 14(12):2458.
https://doi.org/10.3390/electronics14122458
Chicago/Turabian Style
Lin, Jinwei, Tao Ji, Han Zhu, Yunlong Wang, Jialei Hu, Yonghao Sun, and Wei Wang.
2025. "Low-Cost Robust Detection Method of Interturn Short-Circuit Fault for Distribution Transformer Based on ΔU-I Locus Characteristic" Electronics 14, no. 12: 2458.
https://doi.org/10.3390/electronics14122458
APA Style
Lin, J., Ji, T., Zhu, H., Wang, Y., Hu, J., Sun, Y., & Wang, W.
(2025). Low-Cost Robust Detection Method of Interturn Short-Circuit Fault for Distribution Transformer Based on ΔU-I Locus Characteristic. Electronics, 14(12), 2458.
https://doi.org/10.3390/electronics14122458