Liu, R.; Xie, Y.; Dang, Z.; Hao, J.; Quan, X.; Xiao, Y.; Peng, C.
Dynamic Vulnerability Knowledge Graph Construction via Multi-Source Data Fusion and Large Language Model Reasoning. Electronics 2025, 14, 2334.
https://doi.org/10.3390/electronics14122334
AMA Style
Liu R, Xie Y, Dang Z, Hao J, Quan X, Xiao Y, Peng C.
Dynamic Vulnerability Knowledge Graph Construction via Multi-Source Data Fusion and Large Language Model Reasoning. Electronics. 2025; 14(12):2334.
https://doi.org/10.3390/electronics14122334
Chicago/Turabian Style
Liu, Ruitong, Yaxuan Xie, Zexu Dang, Jinyi Hao, Xiaowen Quan, Yongcai Xiao, and Chunlei Peng.
2025. "Dynamic Vulnerability Knowledge Graph Construction via Multi-Source Data Fusion and Large Language Model Reasoning" Electronics 14, no. 12: 2334.
https://doi.org/10.3390/electronics14122334
APA Style
Liu, R., Xie, Y., Dang, Z., Hao, J., Quan, X., Xiao, Y., & Peng, C.
(2025). Dynamic Vulnerability Knowledge Graph Construction via Multi-Source Data Fusion and Large Language Model Reasoning. Electronics, 14(12), 2334.
https://doi.org/10.3390/electronics14122334
