Next Article in Journal
Threat Classification and Vulnerability Analysis on 5G Firmware Over-the-Air Updates for Mobile and Automotive Platforms
Previous Article in Journal
Efficient Steel Surface Defect Detection via a Lightweight YOLO Framework with Task-Specific Knowledge-Guided Optimization
Previous Article in Special Issue
Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights
 
 
Article

Article Versions Notes

Electronics 2025, 14(10), 2032; https://doi.org/10.3390/electronics14102032
Action Date Notes Link
article xml file uploaded 16 May 2025 12:38 CEST Original file -
article xml uploaded. 16 May 2025 12:38 CEST Update https://www.mdpi.com/2079-9292/14/10/2032/xml
article pdf uploaded. 16 May 2025 12:38 CEST Version of Record https://www.mdpi.com/2079-9292/14/10/2032/pdf
article html file updated 16 May 2025 12:43 CEST Original file https://www.mdpi.com/2079-9292/14/10/2032/html
Back to TopTop