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Journal: Electronics, 2025
Volume: 14
Number: 178

Article: NI-LIO: A Hybrid Approach Combining ICP and NDT for Improving Simultaneous Localization and Mapping Performance
Authors: by Jie Yu, Ting-Hai Yu, Qing-Yong Zhang and Trong-The Nguyen
Link: https://www.mdpi.com/2079-9292/14/1/178

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