Chen, Y.; Li, Y.; Wang, J.; Lu, L.; Wang, H.; Li, M.; Xu, W.; Shi, C.; Li, C.
Characterization of Breakdown Arcs Induced by Venting Particles Generated by Thermal Runaway of Large-Capacity Ternary Lithium-Ion Batteries. Electronics 2024, 13, 3168.
https://doi.org/10.3390/electronics13163168
AMA Style
Chen Y, Li Y, Wang J, Lu L, Wang H, Li M, Xu W, Shi C, Li C.
Characterization of Breakdown Arcs Induced by Venting Particles Generated by Thermal Runaway of Large-Capacity Ternary Lithium-Ion Batteries. Electronics. 2024; 13(16):3168.
https://doi.org/10.3390/electronics13163168
Chicago/Turabian Style
Chen, Yuhao, Yalun Li, Juan Wang, Languang Lu, Hewu Wang, Minghai Li, Wenqiang Xu, Chao Shi, and Cheng Li.
2024. "Characterization of Breakdown Arcs Induced by Venting Particles Generated by Thermal Runaway of Large-Capacity Ternary Lithium-Ion Batteries" Electronics 13, no. 16: 3168.
https://doi.org/10.3390/electronics13163168
APA Style
Chen, Y., Li, Y., Wang, J., Lu, L., Wang, H., Li, M., Xu, W., Shi, C., & Li, C.
(2024). Characterization of Breakdown Arcs Induced by Venting Particles Generated by Thermal Runaway of Large-Capacity Ternary Lithium-Ion Batteries. Electronics, 13(16), 3168.
https://doi.org/10.3390/electronics13163168
