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Bevilacqua F, D’Agostino F, Ferrara F, Gennarelli C, Guerriero R, Migliozzi M, Riccio G. Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning. Electronics. 2023; 12(3):542. https://doi.org/10.3390/electronics12030542

Bevilacqua, Florindo, Francesco D’Agostino, Flaminio Ferrara, Claudio Gennarelli, Rocco Guerriero, Massimo Migliozzi, and Giovanni Riccio. 2023. "Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning" Electronics 12, no. 3: 542. https://doi.org/10.3390/electronics12030542

Bevilacqua, F., D’Agostino, F., Ferrara, F., Gennarelli, C., Guerriero, R., Migliozzi, M., & Riccio, G. (2023). Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning. Electronics, 12(3), 542. https://doi.org/10.3390/electronics12030542