Bevilacqua, F.; D’Agostino, F.; Ferrara, F.; Gennarelli, C.; Guerriero, R.; Migliozzi, M.; Riccio, G.
Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning. Electronics 2023, 12, 542.
https://doi.org/10.3390/electronics12030542
AMA Style
Bevilacqua F, D’Agostino F, Ferrara F, Gennarelli C, Guerriero R, Migliozzi M, Riccio G.
Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning. Electronics. 2023; 12(3):542.
https://doi.org/10.3390/electronics12030542
Chicago/Turabian Style
Bevilacqua, Florindo, Francesco D’Agostino, Flaminio Ferrara, Claudio Gennarelli, Rocco Guerriero, Massimo Migliozzi, and Giovanni Riccio.
2023. "Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning" Electronics 12, no. 3: 542.
https://doi.org/10.3390/electronics12030542
APA Style
Bevilacqua, F., D’Agostino, F., Ferrara, F., Gennarelli, C., Guerriero, R., Migliozzi, M., & Riccio, G.
(2023). Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning. Electronics, 12(3), 542.
https://doi.org/10.3390/electronics12030542
