Echeverri-Ocampo, I.; Ardila, K.; Molina-Mateo, J.; Padilla-Buritica, J.I.; Carceller, H.; Barceló-Martinez, E.A.; Llamur, S.I.; Iglesia-Vaya, M.d.l.
EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification. Electronics 2023, 12, 4432.
https://doi.org/10.3390/electronics12214432
AMA Style
Echeverri-Ocampo I, Ardila K, Molina-Mateo J, Padilla-Buritica JI, Carceller H, Barceló-Martinez EA, Llamur SI, Iglesia-Vaya Mdl.
EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification. Electronics. 2023; 12(21):4432.
https://doi.org/10.3390/electronics12214432
Chicago/Turabian Style
Echeverri-Ocampo, Isabel, Karen Ardila, José Molina-Mateo, J. I. Padilla-Buritica, Héctor Carceller, Ernesto A. Barceló-Martinez, S. I. Llamur, and Maria de la Iglesia-Vaya.
2023. "EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification" Electronics 12, no. 21: 4432.
https://doi.org/10.3390/electronics12214432
APA Style
Echeverri-Ocampo, I., Ardila, K., Molina-Mateo, J., Padilla-Buritica, J. I., Carceller, H., Barceló-Martinez, E. A., Llamur, S. I., & Iglesia-Vaya, M. d. l.
(2023). EEG-Based Functional Connectivity Analysis for Cognitive Impairment Classification. Electronics, 12(21), 4432.
https://doi.org/10.3390/electronics12214432
