Cui, Y.; Wang, C.; Liu, X.; Wu, Y.; Li, Z.; Li, R.; He, W.
Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots. Electronics 2023, 12, 3868.
https://doi.org/10.3390/electronics12183868
AMA Style
Cui Y, Wang C, Liu X, Wu Y, Li Z, Li R, He W.
Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots. Electronics. 2023; 12(18):3868.
https://doi.org/10.3390/electronics12183868
Chicago/Turabian Style
Cui, Yana, Chunyang Wang, Xuelian Liu, Yajie Wu, Zhengze Li, Rong Li, and Wen He.
2023. "Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots" Electronics 12, no. 18: 3868.
https://doi.org/10.3390/electronics12183868
APA Style
Cui, Y., Wang, C., Liu, X., Wu, Y., Li, Z., Li, R., & He, W.
(2023). Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots. Electronics, 12(18), 3868.
https://doi.org/10.3390/electronics12183868
