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Journal: Electronics, 2023
Volume: 12
Number: 2529

Article: Threshold Voltage Measurement Protocol “Triple Sense” Applied to GaN HEMTs
Authors: by Tamiris Grossl Bade, Hassan Hamad, Adrien Lambert, Hervé Morel and Dominique Planson
Link: https://www.mdpi.com/2079-9292/12/11/2529

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