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Journal: Electronics, 2023
Volume: 12
Number: 2398
Article:
Total Ionizing Dose Effects of 60Co γ-Ray Radiation on Split-Gate SiC MOSFETs
Authors:
by
Haonan Feng, Xiaowen Liang, Xiaojuan Pu, Yutang Xiang, Teng Zhang, Ying Wei, Jie Feng, Jing Sun, Dan Zhang, Yudong Li, Xuefeng Yu and Qi Guo
Link:
https://www.mdpi.com/2079-9292/12/11/2398
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