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Deng S, Deng L, Sun T, Yu S, Wang L, Chen B, Hu H, Xie Y, Yin H, Xiao J, et al. EEDD: Edge-Guided Energy-Based PCB Defect Detection. Electronics. 2023; 12(10):2306. https://doi.org/10.3390/electronics12102306

Deng, Shuixin, Lei Deng, Ting Sun, Shijie Yu, Li Wang, Baohua Chen, Hao Hu, Yusen Xie, Hanxi Yin, Junwei Xiao, and et al. 2023. "EEDD: Edge-Guided Energy-Based PCB Defect Detection" Electronics 12, no. 10: 2306. https://doi.org/10.3390/electronics12102306

Deng, S., Deng, L., Sun, T., Yu, S., Wang, L., Chen, B., Hu, H., Xie, Y., Yin, H., Xiao, J., Cui, X., Fu, Y., Tang, X., Song, R., Li, L., Xiao, S., Li, Y., & Li, Y. (2023). EEDD: Edge-Guided Energy-Based PCB Defect Detection. Electronics, 12(10), 2306. https://doi.org/10.3390/electronics12102306