Deng, S.; Deng, L.; Sun, T.; Yu, S.; Wang, L.; Chen, B.; Hu, H.; Xie, Y.; Yin, H.; Xiao, J.;
et al. EEDD: Edge-Guided Energy-Based PCB Defect Detection. Electronics 2023, 12, 2306.
https://doi.org/10.3390/electronics12102306
AMA Style
Deng S, Deng L, Sun T, Yu S, Wang L, Chen B, Hu H, Xie Y, Yin H, Xiao J,
et al. EEDD: Edge-Guided Energy-Based PCB Defect Detection. Electronics. 2023; 12(10):2306.
https://doi.org/10.3390/electronics12102306
Chicago/Turabian Style
Deng, Shuixin, Lei Deng, Ting Sun, Shijie Yu, Li Wang, Baohua Chen, Hao Hu, Yusen Xie, Hanxi Yin, Junwei Xiao,
and et al. 2023. "EEDD: Edge-Guided Energy-Based PCB Defect Detection" Electronics 12, no. 10: 2306.
https://doi.org/10.3390/electronics12102306
APA Style
Deng, S., Deng, L., Sun, T., Yu, S., Wang, L., Chen, B., Hu, H., Xie, Y., Yin, H., Xiao, J., Cui, X., Fu, Y., Tang, X., Song, R., Li, L., Xiao, S., Li, Y., & Li, Y.
(2023). EEDD: Edge-Guided Energy-Based PCB Defect Detection. Electronics, 12(10), 2306.
https://doi.org/10.3390/electronics12102306