Li, C.; Xie, J.; Cheng, Y.; Zhang, Z.; Chen, J.; Wang, H.; Tao, H.
Research on the Construction of High-Trust Root Zone File Based on Multi-Source Data Verification. Electronics 2023, 12, 2264.
https://doi.org/10.3390/electronics12102264
AMA Style
Li C, Xie J, Cheng Y, Zhang Z, Chen J, Wang H, Tao H.
Research on the Construction of High-Trust Root Zone File Based on Multi-Source Data Verification. Electronics. 2023; 12(10):2264.
https://doi.org/10.3390/electronics12102264
Chicago/Turabian Style
Li, Chao, Jiagui Xie, Yanan Cheng, Zhaoxin Zhang, Jian Chen, Haochuan Wang, and Hanyu Tao.
2023. "Research on the Construction of High-Trust Root Zone File Based on Multi-Source Data Verification" Electronics 12, no. 10: 2264.
https://doi.org/10.3390/electronics12102264
APA Style
Li, C., Xie, J., Cheng, Y., Zhang, Z., Chen, J., Wang, H., & Tao, H.
(2023). Research on the Construction of High-Trust Root Zone File Based on Multi-Source Data Verification. Electronics, 12(10), 2264.
https://doi.org/10.3390/electronics12102264