Memar, P.; Vankeirsbilck, J.; Vanoost, D.; Claeys, T.; Pissoort, D.; Boydens, J.
Resilience of Reed-Solomon Codes against Single-Frequency Electromagnetic Disturbances: Fault Mechanisms and Fault Elimination through Symbol Inversion. Electronics 2022, 11, 1292.
https://doi.org/10.3390/electronics11091292
AMA Style
Memar P, Vankeirsbilck J, Vanoost D, Claeys T, Pissoort D, Boydens J.
Resilience of Reed-Solomon Codes against Single-Frequency Electromagnetic Disturbances: Fault Mechanisms and Fault Elimination through Symbol Inversion. Electronics. 2022; 11(9):1292.
https://doi.org/10.3390/electronics11091292
Chicago/Turabian Style
Memar, Pejman, Jens Vankeirsbilck, Dries Vanoost, Tim Claeys, Davy Pissoort, and Jeroen Boydens.
2022. "Resilience of Reed-Solomon Codes against Single-Frequency Electromagnetic Disturbances: Fault Mechanisms and Fault Elimination through Symbol Inversion" Electronics 11, no. 9: 1292.
https://doi.org/10.3390/electronics11091292
APA Style
Memar, P., Vankeirsbilck, J., Vanoost, D., Claeys, T., Pissoort, D., & Boydens, J.
(2022). Resilience of Reed-Solomon Codes against Single-Frequency Electromagnetic Disturbances: Fault Mechanisms and Fault Elimination through Symbol Inversion. Electronics, 11(9), 1292.
https://doi.org/10.3390/electronics11091292
