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Journal: Electronics, 2022
Volume: 11
Number: 307

Article: Characterizing THz Scattering Loss in Nano-Scale SOI Waveguides Exhibiting Stochastic Surface Roughness with Exponential Autocorrelation
Authors: by Brian Guiana and Ata Zadehgol
Link: https://www.mdpi.com/2079-9292/11/3/307

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