Order Article Reprints

Zhang Q, Liu L, Yuan Y, Zhang Z, He J, Gao Y, Li Y, Guo X, Zhao Y. A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3. Electronics. 2022; 11(24):4216. https://doi.org/10.3390/electronics11244216

Zhang, Qizhi, Liang Liu, Yidong Yuan, Zhe Zhang, Jiaji He, Ya Gao, Yao Li, Xiaolong Guo, and Yiqiang Zhao. 2022. "A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3" Electronics 11, no. 24: 4216. https://doi.org/10.3390/electronics11244216

Zhang, Q., Liu, L., Yuan, Y., Zhang, Z., He, J., Gao, Y., Li, Y., Guo, X., & Zhao, Y. (2022). A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3. Electronics, 11(24), 4216. https://doi.org/10.3390/electronics11244216