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Journal: Electronics, 2022
Volume: 11
Number: 3601
Article:
Hot Carrier Injection Reliability in Nanoscale Field Effect Transistors: Modeling and Simulation Methods
Authors:
by
Yimin Wang, Yun Li, Yanbin Yang and Wenchao Chen
Link:
https://www.mdpi.com/2079-9292/11/21/3601
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