Revisiting Dropout: Escaping Pressure for Training Neural Networks with Multiple Costs
Woo, S.; Kim, K.; Noh, J.; Shin, J.-H.; Na, S.-H. Revisiting Dropout: Escaping Pressure for Training Neural Networks with Multiple Costs. Electronics 2021, 10, 989. https://doi.org/10.3390/electronics10090989
Woo S, Kim K, Noh J, Shin J-H, Na S-H. Revisiting Dropout: Escaping Pressure for Training Neural Networks with Multiple Costs. Electronics. 2021; 10(9):989. https://doi.org/10.3390/electronics10090989
Chicago/Turabian StyleWoo, Sangmin, Kangil Kim, Junhyug Noh, Jong-Hun Shin, and Seung-Hoon Na. 2021. "Revisiting Dropout: Escaping Pressure for Training Neural Networks with Multiple Costs" Electronics 10, no. 9: 989. https://doi.org/10.3390/electronics10090989