Chen, R.; Chen, L.; Han, J.; Wang, X.; Liang, Y.; Ma, Y.; Shangguan, S.
Comparative Study on the “Soft Errors” Induced by Single-Event Effect and Space Electrostatic Discharge. Electronics 2021, 10, 802.
https://doi.org/10.3390/electronics10070802
AMA Style
Chen R, Chen L, Han J, Wang X, Liang Y, Ma Y, Shangguan S.
Comparative Study on the “Soft Errors” Induced by Single-Event Effect and Space Electrostatic Discharge. Electronics. 2021; 10(7):802.
https://doi.org/10.3390/electronics10070802
Chicago/Turabian Style
Chen, Rui, Li Chen, Jianwei Han, Xuan Wang, Yanan Liang, Yingqi Ma, and Shipeng Shangguan.
2021. "Comparative Study on the “Soft Errors” Induced by Single-Event Effect and Space Electrostatic Discharge" Electronics 10, no. 7: 802.
https://doi.org/10.3390/electronics10070802
APA Style
Chen, R., Chen, L., Han, J., Wang, X., Liang, Y., Ma, Y., & Shangguan, S.
(2021). Comparative Study on the “Soft Errors” Induced by Single-Event Effect and Space Electrostatic Discharge. Electronics, 10(7), 802.
https://doi.org/10.3390/electronics10070802