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Journal: Electronics, 2021
Volume: 10
Number: 2451

Article: A TaOx-Based RRAM with Improved Uniformity and Excellent Analog Characteristics by Local Dopant Engineering
Authors: by Yabo Qin, Zongwei Wang, Yaotian Ling, Yimao Cai and Ru Huang
Link: https://www.mdpi.com/2079-9292/10/20/2451

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