Ogasahara, Y.; Nakagawa, T.; Sekigawa, T.; Tsutsumi, T.; Koike, H.
Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates. J. Low Power Electron. Appl. 2015, 5, 116-129.
https://doi.org/10.3390/jlpea5020116
AMA Style
Ogasahara Y, Nakagawa T, Sekigawa T, Tsutsumi T, Koike H.
Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates. Journal of Low Power Electronics and Applications. 2015; 5(2):116-129.
https://doi.org/10.3390/jlpea5020116
Chicago/Turabian Style
Ogasahara, Yasuhiro, Tadashi Nakagawa, Toshihiro Sekigawa, Toshiyuki Tsutsumi, and Hanpei Koike.
2015. "Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates" Journal of Low Power Electronics and Applications 5, no. 2: 116-129.
https://doi.org/10.3390/jlpea5020116
APA Style
Ogasahara, Y., Nakagawa, T., Sekigawa, T., Tsutsumi, T., & Koike, H.
(2015). Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates. Journal of Low Power Electronics and Applications, 5(2), 116-129.
https://doi.org/10.3390/jlpea5020116