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Journal: J. Low Power Electron. Appl., 2023
Volume: 13
Number: 48

Article: TCI Tester: A Chip Tester for Inductive Coupling Wireless Through-Chip Interface
Authors: by Hideto Kayashima and Hideharu Amano
Link: https://www.mdpi.com/2079-9268/13/3/48

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