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Journal: J. Low Power Electron. Appl., 2023
Volume: 13
Number: 22

Article: Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions
Authors: by Miikka Runolinna, Matthew Turnquist, Jukka Teittinen, Pauliina Ilmonen and Lauri Koskinen
Link: https://www.mdpi.com/2079-9268/13/1/22

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