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Journal: Coatings, 2019
Volume: 9
Number: 416
416
Article: Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
Authors: by Jiří Vohánka, Ivan Ohlídal, Miloslav Ohlídal, Štěpán Šustek, Martin Čermák, Václav Šulc, Petr Vašina, Jaroslav Ženíšek and Daniel Franta
Link: https://www.mdpi.com/2079-6412/9/7/416

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