Naghdali, S.; Waldl, H.; Schiester, M.; Pohler, M.; Czettl, C.; Tkadletz, M.; Schalk, N.
High-Resolution Investigation of the Interfaces in Cathodic Arc Evaporated TiN/CrAlN Multilayer Coatings. Coatings 2026, 16, 438.
https://doi.org/10.3390/coatings16040438
AMA Style
Naghdali S, Waldl H, Schiester M, Pohler M, Czettl C, Tkadletz M, Schalk N.
High-Resolution Investigation of the Interfaces in Cathodic Arc Evaporated TiN/CrAlN Multilayer Coatings. Coatings. 2026; 16(4):438.
https://doi.org/10.3390/coatings16040438
Chicago/Turabian Style
Naghdali, Saeideh, Helene Waldl, Maximilian Schiester, Markus Pohler, Christoph Czettl, Michael Tkadletz, and Nina Schalk.
2026. "High-Resolution Investigation of the Interfaces in Cathodic Arc Evaporated TiN/CrAlN Multilayer Coatings" Coatings 16, no. 4: 438.
https://doi.org/10.3390/coatings16040438
APA Style
Naghdali, S., Waldl, H., Schiester, M., Pohler, M., Czettl, C., Tkadletz, M., & Schalk, N.
(2026). High-Resolution Investigation of the Interfaces in Cathodic Arc Evaporated TiN/CrAlN Multilayer Coatings. Coatings, 16(4), 438.
https://doi.org/10.3390/coatings16040438