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Lee D-H, Kim D-H, Jeong H-S, Hwang S-H, Lee S, Kim M-H, Lim JH, Kwon H-I. Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage Characteristics. Coatings. 2021; 11(9):1135. https://doi.org/10.3390/coatings11091135

Lee, Dong-Ho, Dae-Hwan Kim, Hwan-Seok Jeong, Seong-Hyun Hwang, Sunhee Lee, Myeong-Ho Kim, Jun Hyung Lim, and Hyuck-In Kwon. 2021. "Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage Characteristics" Coatings 11, no. 9: 1135. https://doi.org/10.3390/coatings11091135

Lee, D.-H., Kim, D.-H., Jeong, H.-S., Hwang, S.-H., Lee, S., Kim, M.-H., Lim, J. H., & Kwon, H.-I. (2021). Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage Characteristics. Coatings, 11(9), 1135. https://doi.org/10.3390/coatings11091135