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Journal: Coatings, 2021
Volume: 11
Number: 1135

Article: Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage Characteristics
Authors: by Dong-Ho Lee, Dae-Hwan Kim, Hwan-Seok Jeong, Seong-Hyun Hwang, Sunhee Lee, Myeong-Ho Kim, Jun Hyung Lim and Hyuck-In Kwon
Link: https://www.mdpi.com/2079-6412/11/9/1135

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